Title
Investigating the optical properties of graphene with spectroscopic ellipsometry
Creator
Matković, Aleksandar V.
Copyright date
2015
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Autorstvo 3.0 Srbija (CC BY 3.0)
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Language
English
Cobiss-ID
Theses Type
Doktorska disertacija
description
Datum odbrane: 12.06.2015.
Other responsibilities
mentor
Gajić, Radoš
član komisije
Milošević, Ivanka, 1962-
član komisije
Belča, Ivan, 1964-
član komisije
Radović, Zoran, 1946-
Academic Expertise
Prirodno-matematičke nauke
Academic Title
-
University
Univerzitet u Beogradu
Faculty
Fizički fakultet
Alternative title
Ispitivanje optičkih osobina grafena pomoću spektroskopske elipsometrije
Publisher
[A. V. Matković]
Format
XIII, 242 lista
description
Physics - Condensed Matter Physics and Statistical Physics / Fizika - Fizika kondenzovane materije i statistiˇcka fizika
Abstract (en)
The dissertation addresses the problem of retrieving the optical properties of
graphene in the visible and UV ranges using ellipsometry. Additionally, it is demonstrated
how changes in these properties could be related to various fabrication aspects
including the transfer process and the interaction of graphene with various
substrates. Besides their importance in advancing the fundamental understanding
of optical properties of graphene, these results could be used for implementation of
ellipsometry as a quality control in graphene-based technologies. As these technologies
expand, it will be increasingly important to have tools which are able not only
to detect the presence of a graphene layer but also to give information of subtle
changes in the properties of these ultra thin films. Ellipsometry, due to its numerous
advantages, is most definitely one of the techniques that will be employed as a
quality control tool in the future mass production of graphene.
In the dissertation optical properties of graphene were studied using spectroscopic
ellipsometry and null spectroscopic imaging ellipsometry techniques. The studied
samples were atomically thin layers of graphene synthesized by micromechanical
exfoliation and chemical vapor deposition. These samples were supported by various
substrates, such as silicon wafers with thin SiO2 films, transparent (sapphire) and
metallic (gold) substrates. An importance of using corroborated measurements for
building up an appropriate optical models has been shown as well.
Optical parameters of graphene have been retrieved using a point-by-point inversion
process, and afterwards parameterized by a dielectric function model. A
proposed parametrization function of graphene’s complex refractive index is based
on a Fano resonant profile. This model has only four fitting parameters, and their
values can be easily related to the properties of the M-point exciton that causes the
red shift of the prominent absorption peak in the UV. Various set of model paramv...
Abstract (sr)
Disertacija se bavi problemom merenja optičkih osobina grafena u vidljivom i
ultraljubičastom delu spektra. Takodje, u disertaciji demonstrirano je kako se
promene optičkih osobina mogu povezati sa pra´cenjem procesa sinteze, transfera, kao
i interakcije grafena sa supstratom. Osim značaja za fundamentalno razumevanje
optičkih osobina grafena, prikazani rezultati mogu se iskoristiti za implementaciju
elipsometrije kao tehnike za kontrolu kvaliteta u novim tehnologijama zasnovanim
na grafenu. Sa daljim razvojem ovih tehnologija, neophodno je imati adekvantne
merne tehnike koje nisu osetljive samo na prisustvo mono-atomskog sloja, već su u
stanju da pouzdano detektuju fine promene u osobinama ovih ultra tankih filmova.
Zbog svojih brojnih prednosti, elipsometrija je zasigurno jedna od tehnika koja će
biti korišćena za kontrolu kvaliteta, kao i procesa sinteze u budu´cim tehnologijama
za masovnu proizvodnju grafena.
U disertaciji optičke osobine grafena su merene pomo´cu tehnika nulirajuće i spektroskopske
elipsometrije. Ispitivani su uzorci monoatomskih slojeva grafena, sintetisanih
pomoću mikromehaničke eksfolijacije i depozicije iz gasne faze. Takodje,
istaknut je značaj korišćenja korelacionih merenja za formiranje optičkih modela i
interpretaciju elipsometarskih merenja grafena.
Optičke konstante grafena su dobijene pomoću matematičke inverzije, a zatim
parametrizovane pomoću modela dielektrične funkcije grafena. Predloženi model
kompleksnog indeksa prelamanja grafena je zasnovan na Fano rezonantnom profilu.
Ovaj model ima samo četiri parametra čije se vrednosti mogu jednostavno povezati
sa osobinama eksitona u M-tački, koji izaziva crveni pomeraj apsorpcionog maksimuma
u ultraljubičastom delu spektra. Različiti parametri modela dielektrične
funkcije su prezentovani u disertaciji. Ovi parametri opisuju različite optičke osobine
grafena koje su rezultat interakcije izmedju grafena i njegove okoline, eksternih
vi
Authors Key words
graphene, optical properties of graphene, spectroscopic ellipsometry
Authors Key words
grafen, optičke osobine grafena, spektroskopska elipsometrija
Classification
538.9 (043.3)
Type
Tekst
Abstract (en)
The dissertation addresses the problem of retrieving the optical properties of
graphene in the visible and UV ranges using ellipsometry. Additionally, it is demonstrated
how changes in these properties could be related to various fabrication aspects
including the transfer process and the interaction of graphene with various
substrates. Besides their importance in advancing the fundamental understanding
of optical properties of graphene, these results could be used for implementation of
ellipsometry as a quality control in graphene-based technologies. As these technologies
expand, it will be increasingly important to have tools which are able not only
to detect the presence of a graphene layer but also to give information of subtle
changes in the properties of these ultra thin films. Ellipsometry, due to its numerous
advantages, is most definitely one of the techniques that will be employed as a
quality control tool in the future mass production of graphene.
In the dissertation optical properties of graphene were studied using spectroscopic
ellipsometry and null spectroscopic imaging ellipsometry techniques. The studied
samples were atomically thin layers of graphene synthesized by micromechanical
exfoliation and chemical vapor deposition. These samples were supported by various
substrates, such as silicon wafers with thin SiO2 films, transparent (sapphire) and
metallic (gold) substrates. An importance of using corroborated measurements for
building up an appropriate optical models has been shown as well.
Optical parameters of graphene have been retrieved using a point-by-point inversion
process, and afterwards parameterized by a dielectric function model. A
proposed parametrization function of graphene’s complex refractive index is based
on a Fano resonant profile. This model has only four fitting parameters, and their
values can be easily related to the properties of the M-point exciton that causes the
red shift of the prominent absorption peak in the UV. Various set of model paramv...
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